R. Rosa

发表

The Merli–Missiroli–Pozzi Two-Slit Electron-Interference Experiment

R. Rosa, 2012, Physics in perspective.

Multiple scattering and central limit theorem: A monte carlo approach

R. Rosa, A. Desalvo, 1975 .

Quantitative Thin-Film X-ray Microanalysis by STEM/HAADF: Statistical Analysis for Precision and Accuracy Determination

A. Armigliato, R. Balboni, R. Rosa, 2006, Microscopy and Microanalysis.

Determination of composition and thickness of TiNxOy films on silicon by combined x-ray and nuclear microanalysis

A. Armigliato, R. Rosa, M. Berti, 1983 .

Axial and Planar Channeling in TiOx System

G. G. Bentini, G. D. Mea, P. Mazzoldi, 1975 .

Application of Monte Carlo technique to the electron probe microanalysis of ternary Si-B-O films on silicon

A. Armigliato, R. Rinaldi, R. Rosa, 1979 .

Dose dependence of penetration and damage profiles of P+-channeled ions in silicon simulated by computer

F. Zignani, R. Rosa, A. Desalvo, 1975 .

Computer evaluation of primary deposited energy profiles in ion‐implanted silicon under channeling conditions

F. Zignani, R. Rosa, A. Desalvo, 1972 .

Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry

F. Romanato, S. Iyer, M. Mazzer, 1992 .

A dielectric calculation of energy loss to valence electrons of channelled protons in silicon

R. Rosa, A. Desalvo, 1977 .

Monte Carlo simulation of elastic and inelastic scattering of electrons in thin films. II. Core electron losses

R. Rosa, A. Desalvo, 1984 .

Experimental and computer analysis of P+‐ion penetration tails in a SIO2‐Si two‐layer system

F. Zignani, R. Rosa, A. Desalvo, 1980 .

Monte Carlo calculations on spatial distribution of implanted ions in silicon

R. Rosa, A. Desalvo, 1976 .

Energy loss of protons channelling through very thin gold

F. Zignani, E. Machlin, R. Rosa, 1970 .

Computer studies of dechanneling effects on ion implantation profiles

F. Zignani, R. Rosa, A. Desalvo, 1971 .

Oxygen and implanted ion profiles in oxidized zirconium

A. Armigliato, A. Carnera, R. Rosa, 1981 .

Vectorized code for the spin-exchange kinetic Ising model with nearest- and next-nearest-neighbour interactions in diamond lattice

R. Rosa, E. Albertazzi, A. Desalvo, 1993 .

Vectorized code for the three-dimensional spin-exchange kinetic Ising model on cubic and diamond lattices

A. Desalvo, R. Rosa, G. Erbacci, 1990 .

Computer analysis of the axial-to-planar channeling transition: Linkage with continuum theory

R. Rosa, A. Desalvo, 1974 .

On the Use of the GeLα Line in Thin Film X-Ray Microanalysis of Si1-xGex/Si Heterostructures

A. Armigliato, R. Rosa, T. Lewis, 1996 .

X-Ray Microanalysis Combined with Monte Carlo Simulation for the Analysis of Layered Thin Films: The Case of Carbon Contamination

A. Armigliato, R. Rosa, 2009, Microscopy and Microanalysis.

Feeding-in and blocking phenomena explained in terms of a simple diffusion model

A. Carnera, R. Rosa, A. Desalvo, 1977 .

Application of the parametric bootstrap method to determine statistical errors in quantitative X‐ray microanalysis of thin films

A. Armigliato, R. Balboni, R. Rosa, 2007, Journal of microscopy.