J.Th.M. De Hosson

Piezoresponse force microscopy of ferroelectric thin films : Frequency dependence of phase imaging

A. Morelli, Georgios Palasantzas, G. Palasantzas, 2008 .

Effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity

Toh-Ming Lu, Yiping Zhao, Gwo-Ching Wang, 2001 .

Evolution of normal stress and surface roughness in buckled thin films

Georgios Palasantzas, G. Palasantzas, J. D. Hosson, 2003 .

A quantitative analysis of surface deformation by stick/slip atomic force microscopy

J. Kerssemakers, J. D. Hosson, J.Th.M. De Hosson, 1997 .