Dong Yeon Lee

A new nano-accuracy AFM system for minimizing Abbe errors and the evaluation of its measuring uncertainty.

D. Gweon, Dongmin Kim, Dong Yeon Lee, 2007, Ultramicroscopy.

Alert Patches Embedding Conjugated Polymeric Lamellar and Metal Nanoparticles Generating Optoelectronic Responses against Thermal Stresses

D. Ahn, T. Won, Dong Yeon Lee, 2022, Macromolecular Research.