Eric W. Strid

Accuracy improvements in microwave noise parameter measurements

Andrew C. Davidson, Bernard W. Leake, Eric W. Strid, 1989 .

High-Throughput RFIC Wafer Testing

Eric W. Strid, 2001, 57th ARFTG Conference Digest.

3D-TSV Test Options and Process Compatibility

Kenneth R. Smith, Eric W. Strid, Peter Hanaway, 2011 .

Accurate measurement of high-speed package and interconnect parasitics

Eric W. Strid, Dale E. Carlton, K. R. Gleason, 1988, Proceedings of the IEEE 1988 Custom Integrated Circuits Conference.

Chapter 2 Electronic Wafer Probing Techniques

Hermann Schumacher, Eric W. Strid, 1990 .