A. Ogunniyi

Time dependence of bias-stress induced threshold-voltage instability measurements

N. Goldsman, M. Gurfinkel, J. Suehle, 2007, 2007 International Semiconductor Device Research Symposium.

Advanced silicon carbide gate turn-off thyristor for energy conversion and power grid applications

H. O'Brien, C. Scozzie, C. Capell, 2012, 2012 IEEE Energy Conversion Congress and Exposition (ECCE).

Evaluation of 4H-SiC DMOSFETs for power converter applications

B. Hull, D. Urciuoli, R. Green, 2007, 2007 International Semiconductor Device Research Symposium.