G. Mills

Scanning Hall probe microscopy on an atomic force microscope tip

John M. R. Weaver, J. Weaver, H. Zhou, 2001 .

Scanning thermal microscopy using batch fabricated thermocouple probes

John M. R. Weaver, J. Weaver, H. Zhou, 1998 .

SThM Temperature Mapping and Nonlinear Thermal Resistance Evolution With Bias on AlGaN/GaN HEMT Devices

S. Cassette, O. Durand, R. Aubry, 2007, IEEE Transactions on Electron Devices.

Generic scanned-probe microscope sensors by combined micromachining and electron-beam lithography

S. K. Murad, Haiping Zhou, Stephen Thoms, 1998 .

Recent progress in the functionalization of atomic force microscope probes using electron-beam nanolithography

John M. R. Weaver, J. Weaver, H. Zhou, 1999 .

Detection of subsurface voids using scanning thermal microscopy

John M. R. Weaver, J. Weaver, J. Carrejo, 1999 .