P.H. Eaton

Variation of digital SET pulse widths and the implications for single event hardening of advanced CMOS processes

P. Eaton, M. Gadlage, T. Turflinger, 2005, IEEE Transactions on Nuclear Science.

Implications of Total Dose on Single-Event Transient (SET) Pulse Width Measurement Techniques

B. Narasimham, B.L. Bhuva, A. Balasubramanian, 2008, IEEE Transactions on Nuclear Science.

Effect of Voltage Fluctuations on the Single Event Transient Response of Deep Submicron Digital Circuits

B. Narasimham, B.L. Bhuva, peixiong zhao, 2007, IEEE Transactions on Nuclear Science.