文
论文分享
演练场
杂货铺
论文推荐
字
编辑器下载
登录
注册
D.G. Mavis
发表
Variation of digital SET pulse widths and the implications for single event hardening of advanced CMOS processes
P. Eaton, M. Gadlage, T. Turflinger, 2005, IEEE Transactions on Nuclear Science.