B.E. Weir

High Frequency Modulation And Efficient Fiber Coupling Of Vertical Cavity Surface Emitting Lasiers

G. Hasnain, K. Tai, B. Weir, 1990, LEOS '90. Conference Proceedings IEEE Lasers and Electro-Optics Society 1990 Annual Meeting.

Explanation of stress-induced damage in thin oxides

P.J. Silverman, B. Weir, P. Silverman, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

Gate oxides in 50 nm devices: thickness uniformity improves projected reliability

A. Ghetti, J. Madic, J.D. Bude, 1999, International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).

Ultra-thin gate dielectrics: they break down, but do they fail?

D. Hwang, P.J. Silverman, F. Baumann, 1997, International Electron Devices Meeting. IEDM Technical Digest.