R. Entner

Investigation of NBTI Recovery During Measurement

Tibor Grasser, Hubert Enichlmair, Rainer Minixhofer, 2006 .

Modeling of Tunneling Currents for Highly Degraded CMOS Devices

S. Selberherr, T. Grasser, H. Kosina, 2005, 2005 International Conference On Simulation of Semiconductor Processes and Devices.

Three-Dimensional Transient Electro-Thermal Interconnect Simulation for Stress and Electromigration Analysis

Siegfried Selberherr, Tibor Grasser, Hajdin Ceric, 2005 .

On the Highest Order Moment Closure Problem

Tibor Grasser, R. Entner, R. Kosik, 2004 .

A comparison of quantum correction models for the three-dimensional simulation of FinFET structures

S. Selberherr, T. Grasser, A. Gehring, 2004, 27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004..

Impact of Multi-Trap Assisted Tunneling on Gate Leakage of CMOS Memory Devices

Siegfried Selberherr, Tibor Grasser, Christian Doppler, 2005 .