Christian Zorn

Acceleration of temperature humidity bias (THB) testing on IGBT modules by high bias levels

Nando Kaminski, N. Kaminski, C. Zorn, 2015, 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD).

Temperature–humidity–bias testing on insulated-gate bipolartransistor modules – failure modes and acceleration due to high voltage

Nando Kaminski, N. Kaminski, C. Zorn, 2015 .