Changmin Choi

Dynamic bias temperature instability-like behaviors under Fowler–Nordheim program/erase stress in nanoscale silicon-oxide-nitride-oxide-silicon memories

Byung-Gook Park, Dong Myong Kim, Jong Duk Lee, 2008 .

A new floating gate cell structure with a silicon-nitride cap layer for sub-20 nm NAND flash memory

Chilhee Chung, Heesoo Kang, Jungdal Choi, 2010, 2010 Symposium on VLSI Technology.

Ultra-energy-efficient analog-to-digital converters based on single-electron transistor/CMOS hybrid technology for biomedical applications

Byung-Gook Park, Dong Myong Kim, In-Young Chung, 2009 .