Isabel C. Teixeira

发表

RTL design validation, DFT and test pattern generation for high defects coverage

João Paulo Teixeira, Marcelino B. Santos, Fernando M. Gonçalves, 2001, IEEE European Test Workshop, 2001..

Control and data acquisition ATCA/AXIe board designed for high system availability and reliability of nuclear fusion experiments

Miguel Correia, Isabel C. Teixeira, António J.N. Batista, 2013 .

Realistic fault analysis of CMOS analog building blocks

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1993, Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Defect-oriented Verilog fault simulation of SoC macros using a stratified fault sampling technique

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

Physical DFT for High Coverage of Realistic Faults

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1992, Proceedings International Test Conference 1992.

Built-in aging monitoring for safety-critical applications

João Paulo Teixeira, Marcelino B. Santos, Ricardo Reis, 2009, 2009 15th IEEE International On-Line Testing Symposium.

Experiments on bridging fault analysis and layout-level DFT for CMOS designs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1993, Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.

Realistic fault extraction for high-quality design and test of VLSI systems

João Paulo Teixeira, Isabel C. Teixeira, Fernando M. Gonçalves, 1997, 1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Performance Failure Prediction Using Built-In Delay Sensors in FPGAs

João Paulo Teixeira, Fabian Vargas, Isabel C. Teixeira, 2011, 2011 21st International Conference on Field Programmable Logic and Applications.

Predictive error detection by on-line aging monitoring

João Paulo Teixeira, Marcelino B. Santos, Ricardo Reis, 2010, 2010 IEEE 16th International On-Line Testing Symposium.

Delay-fault tolerance to power supply Voltage disturbances analysis in nanometer technologies

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2009, 2009 15th IEEE International On-Line Testing Symposium.

Hardware/software solution for the automation and real-time control of a wine bottling production line

João Paulo Teixeira, Isabel C. Teixeira, Octávio Páscoa Dias, 2003, EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory Automation. Proceedings (Cat. No.03TH8696).

Test preparation methodology for high coverage of physical defects in CMOS digital ICs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1995, Proceedings the European Design and Test Conference. ED&TC 1995.

Fault-tolerance in FPGA focusing power reduction or performance enhancement

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2015, 2015 16th Latin-American Test Symposium (LATS).

Dynamic fault test and diagnosis in digital systems using multiple clock schemes and multi-VDD test

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2005, 11th IEEE International On-Line Testing Symposium.

Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2013, J. Electron. Test..

Data Acquisition Electronics for PET Mammography Imaging

João Paulo Teixeira, Pedro Neves, Isabel C. Teixeira, 2009, BIODEVICES.

OOM approach for HW/SW co-analysis, specification and design of heterogeneous systems

Isabel C. Teixeira, J. P. Teixeira, Mario Calha, 1996 .

Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2011, 29th VLSI Test Symposium.

Power and Performance Optimization in Long-term Operation

Marcelino B. Santos, Isabel C. Teixeira, C. Leong, 2014 .

Automatic adjustment of a medical imaging data acquisition system to unknown delays in the input communication channels

João Paulo Teixeira, Isabel C. Teixeira, C. Leong, 2012 .

A speller board for personal computer

Isabel C. Teixeira, Mario Calha, M.J. Calha, 1992, Proceedings Euro ASIC '92.

A methodology for testability enhancement at layout level

João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, 1991, J. Electron. Test..

Self-checking and fault tolerance quality assessment using fault sampling

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings..

Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, J. Electron. Test..

RTL test pattern generation for high quality loosely deterministic BIST

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2003, 2003 Design, Automation and Test in Europe Conference and Exhibition.

A strategy for testability enhancement at layout level

João Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, 1990, Proceedings of the European Design Automation Conference, 1990., EDAC..

Towards E-Management as Enabler for Accelerated Change

João Paulo Teixeira, Isabel C. Teixeira, Pedro Moura, 2001, ICEIS.

Performance sensor for tolerance and predictive detection of delay-faults

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2014, 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2008, 2008 14th IEEE International On-Line Testing Symposium.

ATCA/AXIe compatible board for fast control and data acquisition in nuclear fusion experiments

Miguel Correia, Isabel C. Teixeira, Joao M. C. Sousa, 2012 .

Optimizing Functional distribution in Complex System Design

João Paulo Teixeira, Carlos Eduardo Pereira, Leandro Buss Becker, 2000, DIPES.

Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2008, 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems.

On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2004, J. Electron. Test..

Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2015, J. Low Power Electron..

Defect-oriented test quality assessment using fault sampling and simulation

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).

Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

On-Detector Electronics of the Clear PEM Scanner

P. Relvas, João Paulo Teixeira, Pedro Neves, 2009, BIODEVICES.

Performance simulation studies of the clear-PEM DAQ/trigger system

P. Relvas, Isabel C. Teixeira, C. Leong, 2005 .

Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits

João Paulo Teixeira, Isabel C. Teixeira, Juan J. Rodríguez-Andina, 2012, J. Electron. Test..

Process-Centered Information Systems

João Paulo Teixeira, Isabel C. Teixeira, Ana Mendes, 2016 .

On the design of a highly testable cell library

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1992, Microprocess. Microprogramming.

Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems

João Paulo Teixeira, Fabian Vargas, Isabel C. Teixeira, 2008, J. Low Power Electron..

Embedded tutorial: TRP: integrating embedded test and ATE

Yervant Zorian, João Paulo Teixeira, Paolo Prinetto, 2001, DATE '01.

Automation and Real-Time Control of a Wine Bottling Production Line: An Object Oriented Based Hardware/Software Co-Design Case Study

Isabel C. Teixeira, J. P. Teixeira, O. P. Dias, 1998 .

HW/SW specification using OOM techniques

João Paulo Teixeira, Isabel C. Teixeira, Mario Calha, 1996, Proceedings Seventh IEEE International Workshop on Rapid System Prototyping. Shortening the Path from Specification to Prototype.

Time Management for Low-Power Design of Digital Systems

João Paulo Teixeira, Fabian Vargas, Marcelino B. Santos, 2008, J. Low Power Electron..

Challenges of engineering education in a global world

Isabel C. Teixeira, J. Paulo Teixeira, 2013, 2013 1st International Conference of the Portuguese Society for Engineering Education (CISPEE).

Signal Integrity Enhancement in Digital Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2008, IEEE Design & Test of Computers.

Property coverage for quality assessment of fault tolerant or failsafe systems

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2003, 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003..

Test preparation for high coverage of physical defects in CMOS digital ICs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 1995, Proceedings 13th IEEE VLSI Test Symposium.

Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2005, J. Electron. Test..

SEU mitigation exploratory tests in a ITER related FPGA

João Paulo Teixeira, Isabel C. Teixeira, C. Leong, 2017 .

Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2007, 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007).

On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2011, J. Low Power Electron..

Low-sensitivity to process variations aging sensor for automotive safety-critical applications

João Paulo Teixeira, Marcelino B. Santos, Ricardo Reis, 2010, 2010 28th VLSI Test Symposium (VTS).

Modeling and simulation of time domain faults in digital systems

João Paulo Teixeira, Fabian Vargas, Marcelino B. Santos, 2004, Proceedings. 10th IEEE International On-Line Testing Symposium.

Integrated approach for circuit and fault extraction of VLSI circuits

João Paulo Teixeira, Isabel C. Teixeira, Fernando M. Gonçalves, 1996, Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance

João Paulo Teixeira, Fabian Vargas, Isabel C. Teixeira, 2010, J. Low Power Electron..

RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2001, J. Electron. Test..

Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels

João Paulo Teixeira, Isabel C. Teixeira, Pedro Miguel Rodrigues, 2010, Proceedings of 2010 IEEE International Symposium on Circuits and Systems.

Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2007, 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems.

On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2007, 13th IEEE International On-Line Testing Symposium (IOLTS 2007).

Quality of electronic design: from architectural level to test coverage

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2000, Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525).

Built-in Clock Domain Crossing (CDC) test and diagnosis in GALS systems

João Paulo Teixeira, Isabel C. Teixeira, Vasco Bexiga, 2010, 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems.

Performance Sensor for Subthreshold Voltage Operation

Isabel C. Teixeira, Jorge Semião, Hugo Cavalaria, 2017 .

Aging-Aware Power or Frequency Tuning With Predictive Fault Detection

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2012, IEEE Design & Test of Computers.

Lower VDD Operation of FPGA-Based Digital Circuits Through Delay Modeling and Time Borrowing

João Paulo Teixeira, Fabian Vargas, Isabel C. Teixeira, 2011, J. Low Power Electron..

Programmable aging sensor for automotive safety-critical applications

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2010, 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010).

RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, J. Electron. Test..

Functional-oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2006, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems.

Robust solution for synchronous communication among multi clock domains

João Paulo Teixeira, Isabel C. Teixeira, Juan J. Rodríguez-Andina, 2008, APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems.

Experimental validation and performance analysis of the clear-PEM data acquisition electronics

Isabel C. Teixeira, Pedro Rodrigues, Ricardo Bugalho, 2008, 2008 IEEE Nuclear Science Symposium Conference Record.

Performance Sensor for Reliable Operation

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2018, HCI.

RTL level preparation of high-quality/low-energy/low-power BIST

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2002, Proceedings. International Test Conference.

An OO Based Methodology for Real-Time HW/SW Systems Modeling

João Paulo Teixeira, Carlos Eduardo Pereira, Isabel C. Teixeira, 1998, DIPES.

MOSYS: a methodology for automatic object identification from system specification

João Paulo Teixeira, Carlos Eduardo Pereira, Leandro Buss Becker, 2000, Proceedings Third IEEE International Symposium on Object-Oriented Real-Time Distributed Computing (ISORC 2000) (Cat. No. PR00607).

Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures

João Paulo Teixeira, Isabel C. Teixeira, Octávio Páscoa Dias, 1999, J. Electron. Test..

Aging monitoring with local sensors in FPGA-based designs

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2013, 2013 23rd International Conference on Field programmable Logic and Applications.

The influence of clock-gating on NBTI-induced delay degradation

João Paulo Teixeira, Marcelino B. Santos, Isabel C. Teixeira, 2012, 2012 IEEE 18th International On-Line Testing Symposium (IOLTS).

Dynamic fault detection in digital systems using dynamic voltage scaling and multi-temperature schemes

João Paulo Teixeira, Isabel C. Teixeira, Juan J. Rodríguez-Andina, 2006, 12th IEEE International On-Line Testing Symposium (IOLTS'06).

Enhancing the Tolerance to Power-Supply Instability in Digital Circuits

João Paulo Teixeira, Fabian Vargas, Marcelino B. Santos, 2007, IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07).

Investigating the Use of BICS to detect resistive-open defects in SRAMs

João Paulo Teixeira, Isabel C. Teixeira, Letícia Maria Veiras Bolzani, 2010, 2010 IEEE 16th International On-Line Testing Symposium.

Design and test methodology for a reconfigurable PEM data acquisition electronics system

João Paulo Teixeira, Isabel C. Teixeira, Carlos Leong, 2005, International Conference on Field Programmable Logic and Applications, 2005..

CMS physics technical design report: Addendum on high density QCD with heavy ions

H. Stoeck, J. Yarba, F. Arteche, 2007 .

Experimental characterization of the 192 channel Clear-PEM frontend ASIC coupled to a multi-pixel APD readout of LYSO:Ce crystals

Isabel C. Teixeira, C. Leong, P. Lousa, 2009 .