S.K.H. Fung

SOI thermal impedance extraction methodology and its significance for circuit simulation

Chenming Hu, Philip C. H. Chan, Weidong Liu, 2001 .

Tendency for full depletion due to gate tunneling current

Mansun Chan, Chenming Hu, Pin Su, 2002, 2002 IEEE International SOI Conference.

Shot-noise-induced excess low-frequency noise in floating-body partially depleted SOI MOSFET's

Ping Keung Ko, Philip C. H. Chan, P.C.H. Chan, 1999 .

SOI MOSFET design for all-dimensional scaling with short channel, narrow width and ultra-thin films

Mansun Chan, Ping Keung Ko, Chenming Hu, 1995, Proceedings of International Electron Devices Meeting.

An impact ionization model for SOI circuit simulation [MOSFETs]

M. Chan, P. Su, C. Hu, 2002, 2002 IEEE International SOI Conference.

A physically-based low-frequency noise model for NFD SOI MOSFET's

Ping-Keung Ko, Philip C. H. Chan, P. Ko, 1998, 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199).