K.P. Cheung
发表
R. Choi,
G.A. Brown,
R. Choi,
2007,
IEEE Electron Device Letters.
Y. Wang,
R. Choi,
G.A. Brown,
2007,
IEEE Electron Device Letters.
A. Ghetti,
H. Vaidya,
W.Y.C. Lai,
1999,
1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325).
H. Vaidya,
W.Y.C. Lai,
M.R. Pinto,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
A. Ghetti,
J. Bude,
S. Moccio,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
L. Pantisano,
A. Paccagnella,
G. Cellere,
2003,
IEEE Electron Device Letters.
N. Goldsman,
M. Gurfinkel,
Y. Shapira,
2008,
IEEE Transactions on Electron Devices.
L. Pantisano,
K. Cheung,
L. Pantisano,
2001,
IEEE Electron Device Letters.
J.P. Campbell,
J. Suehle,
K. Sheng,
2008,
2008 IEEE International Integrated Reliability Workshop Final Report.
A. V. Davydov,
J.P. Campbell,
A. Shakouri,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
J.P. Campbell,
L.C. Yu,
J. Suehle,
2009,
2009 IEEE International Reliability Physics Symposium.
K. Cheung,
K.P. Cheung,
2006,
IEEE Transactions on Device and Materials Reliability.
K.P. Cheung,
1999,
International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318).
L. Pantisano,
R. Degraeve,
B. Kaczer,
2003,
IEEE International Electron Devices Meeting 2003.
J.P. Campbell,
K.P. Cheung,
J.S. Suehle,
2008,
2008 IEEE International Reliability Physics Symposium.
W.Y.C. Lai,
Y. Ma,
K.P. Cheung,
1998,
IEEE Electron Device Letters.
W.Y.C. Lai,
C. Liu,
W. Lai,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
K.P. Cheung,
1994,
IEEE Electron Device Letters.
J.P. Campbell,
K.P. Cheung,
J.S. Suehle,
2008,
2008 Symposium on VLSI Technology.