Jonghan Kim

Improvement of the tunnel oxide quality by a low thermal budget dual oxidation for flash memories

Sung Tae Ahn, Jonghan Kim, 1997 .

Scaling down of tunnel oxynitride in NAND flash memory: oxynitride selection and reliabilities

Dong Jun Kim, Kyong Moo Mang, S. T. Ahn, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.