Thorsten Matthee

Optimization of the reflectivity of magnetron sputter deposited silver films

Günter Bräuer, Michael Vergöhl, Bernd Szyszka, 2000 .

Ex situ and in situ spectroscopic ellipsometry of MF and DC-sputtered TiO2 and SiO2 films for process control

Michael Vergöhl, U. Richter, T. Staedler, 1999 .

In situ monitoring of optical coatings on architectural glass and comparison of the accuracy of the layer thickness attainable with ellipsometry and photometry

Michael Vergöhl, U. Richter, N. Malkomes, 2001 .