Takeshi Yoshida

发表

Analytical Modelling of Quasi-Breakdown of Ultrathin Gate Oxides under Constant Current Stressing

Seiichi Miyazaki, Masataka Hirose, Takeshi Yoshida, 1996 .

Quantitative Analysis of Tunneling Current through Ultrathin Gate Oxides

Seiichi Miyazaki, Masataka Hirose, J. L. Alay, 1995 .