Jacob C. H. Phang

A robust focusing and astigmatism correction method for the scanning electron microscope—Part II: Autocorrelation-based coarse focusing method

John T. L. Thong, K. H. Ong, Jacob C. H. Phang, 1998 .

Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscope

Kin Leong Pey, K. Pey, D. Chan, 1993 .

Single contact electron beam induced currents (SCEBIC) in semiconductor junctions. Part I: Quantitative verification of SCEBIC model

S. Kolachina, D. Chan, J. Phang, 1998 .

Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

S. Kolachina, Ivica Orlić, Frank Watt, 1997 .

Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope

Yi Liu, Wai Kin Chim, D. Chan, 1997, Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits.