Gaddi S. Haase

Reliability analysis method for low-k interconnect dielectrics breakdown in integrated circuits

Ennis T. Ogawa, Joe W. McPherson, J. McPherson, 2005 .

Failure Analysis Techniques for Microsystems-Enabled Photovoltaics

Murat Okandan, Paiboon Tangyunyong, Gregory N. Nielson, 2014, IEEE Journal of Photovoltaics.

A model for electric degradation of interconnect low-k dielectrics in microelectronic integrated circuits

Gaddi S. Haase, 2009 .