Jean-Michel Mirabel

A new physical-based compact model of floating-gate EEPROM cells

R. Bouchakour, P. Canet, N. Harabech, 2001 .

Improvement of EEPROM cell reliability by optimization of signal programming

R. Bouchakour, P. Canet, N. Harabech, 2001 .

A new floating gate compact model applied to flash memory cell

R. Bouchakour, R. Laffont, Pascal Masson, 2003 .

EEPROM cell design: paradoxical choice of the coupling ratio

R. Bouchakour, P. Canet, F. Lalande, 2003 .

Non-volatile memory cell design: Coupling ratio impact on tunnel oxide reliability

R. Bouchakour, P. Canet, F. Lalande, 2005 .