E.I. Cole

Rapid localization of IC open conductors using charge-induced voltage alteration (CIVA)

E.I. Cole, R.E. Anderson, 1992, 30th Annual Proceedings Reliability Physics 1992.

Resistive contrast imaging: A new SEM mode for failure analysis

C. R. Bagnell, R. H. Propst, F. DiBianca, 1986, IEEE Transactions on Electron Devices.

Human Body Model, Machine Model, and Charge Device Model ESD testing of surface micromachined microelectromechanical systems (MEMS)

J. Soden, E. I. Cole, E.I. Cole, 2001, 2001 Electrical Overstress/Electrostatic Discharge Symposium.

Internal current probing of integrated circuits using magnetic force microscopy

E.I. Cole, R.E. Anderson, A.N. Campbell, 1993, 31st Annual Proceedings Reliability Physics 1993.

Resistive contrast imaging applied to multilevel interconnection failure analysis

E.I. Cole, 1989, Proceedings., Sixth International IEEE VLSI Multilevel Interconnection Conference.