Man Chang

Memory characteristics of a self-assembled monolayer of Pt nanoparticles as a charge trapping layer

Tae-Wook Kim, Hyunsang Hwang, Byung-Sang Choi, 2008, Nanotechnology.

Reversible resistive switching of SrTiOx thin films for nonvolatile memory applications

Dongsoo Lee, Hyunsang Hwang, Hyunjun Sim, 2006 .

Decoupling of cold carrier effects in hot carrier reliability of HfO2 gated nMOSFETs

J.C. Lee, Byoung Hun Lee, G. Bersuker, 2006, 2006 IEEE International Reliability Physics Symposium Proceedings.

Excellent Resistance Switching Characteristics of Pt/Single-crystal Nb-Doped SrTiO3 Schottky Junction

Hyunsang Hwang, Hyunjun Sim, Man Chang, 2006, 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop.

Resistance switching of Al doped ZnO for Non Volatile Memory applications

Dongsoo Lee, Hyunsang Hwang, Dooho Choi, 2006, 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop.

Memory characteristics of silicon nitride with silicon nanocrystals as a charge trapping layer of nonvolatile memory devices

Hyunsang Hwang, Sanghun Jeon, Sangmoo Choi, 2005 .

Contribution of Interface States and Oxide Traps to the Negative Bias Temperature Instability of High- $k$ pMOSFETs

Hyunsang Hwang, Rino Choi, Minseok Jo, 2009 .

Gate voltage dependence on hot carrier degradation at an elevated temperature in a device with ultrathin silicon oxynitride

Hyunsang Hwang, Minseok Jo, H. Hwang, 2009 .