G. Wilkening

Metrological Large Range Scanning Force Microscope Applicable for Traceable Calibration of Surface Textures

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2006 .

Atomic force probe for sidewall scanning of nano- and microstructures

Gaoliang Dai, Frank Pohlenz, Hans-Ulrich Danzebrink, 2006 .

Tactile Dimensional Micrometrology

Uwe Brand, Gaoliang Dai, Ludger Koenders, 2011 .

Accurate and traceable measurement of nano- and microstructures

Gaoliang Dai, Frank Pohlenz, Ludger Koenders, 2006 .