Chang Chang

发表

Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions

Kenneth A. Goldberg, Patrick P. Naulleau, Eric M. Gullikson, 1999 .

Spatial coherence measurement of a high average power table-top soft X-ray laser

Jorge J. Rocca, Fernando Gustavo Tomasel, Chang Chang, 2001 .

Numerical Study on a Bound State in the Continuum Assisted Plasmonic Refractive Index Sensor

Yi Zou, P. Zhou, Chang Chang, 2022, Photonics.

Spatial coherence properties of undulator radiation based on Thompson-Wolf two-pinhole measurement

E. Anderson, D. Attwood, P. Naulleau, 2001 .

Achievement of essentially full spatial coherence in a high-average-power soft-x-ray laser

Jorge J. Rocca, Fernando Gustavo Tomasel, Chang Chang, 2001 .

Coherence Techniques at Extreme Ultraviolet Wavelengths

Chang Chang, 2002 .

Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer.

E. Anderson, D. Attwood, E. Gullikson, 2002, Optics letters.

Direct index of refraction measurement at extreme ultraviolet wavelength region with a novel interferometer

Kenneth A. Goldberg, Patrick P. Naulleau, Eric M. Gullikson, 2001 .

Analysis of illumination coherence properties in small-source systems such as synchrotrons.

D. Attwood, P. Naulleau, Chang Chang, 2003, Applied optics.

Diffractive optical elements based on Fourier optical techniques: a new class of optics for extreme ultraviolet and soft x-ray wavelengths.

Kristine Rosfjord, Chang Chang, Patrick Naulleau, 2002, Applied optics.

The EUV phase-shifting point diffraction interferometer

Kenneth A. Goldberg, Patrick P. Naulleau, Jeffrey Bokor, 2001 .

The PS/PDI: a high accuracy development tool for diffraction limited short-wavelength optics

J. Bokor, D. Attwood, K. Goldberg, 2000 .

Spatial coherence characterization of undulator radiation

Patrick P. Naulleau, Erik H. Anderson, Chang Chang, 2000 .

Recent advances in EUV phase-shifting point diffraction interferometry

Kenneth A. Goldberg, Patrick P. Naulleau, Jeffrey Bokor, 1999, Optics & Photonics.

Characterization of the accuracy of EUV phase-shifting point diffraction interferometry

Kenneth A. Goldberg, Patrick P. Naulleau, Jeffrey Bokor, 1998, Advanced Lithography.

Progress toward submicron hard x-ray imaging using elliptically bent mirrors

Howard A. Padmore, Malcolm R. Howells, Scott C. Locklin, 1997, Optics & Photonics.

Progress toward submicron hard x-ray imaging using elliptically bent mirrors and its applications

Howard A. Padmore, Alastair A. MacDowell, J. R. Patel, 1998, Optics & Photonics.