Yean-Kuen Fang

发表

Effect of Finger Pitch on the Driving Ability of a 40-nm MOSFET With Contact Etch Stop Layer Strain in Multifinger Gated Structure

Ming-Shing Chen, Cheng-I Lin, Sam Chou, 2010, IEEE Transactions on Electron Devices.

New Observations in LOD Effect of 45-nm P-MOSFETs With Strained SiGe Source/Drain and Dummy Gate

Yi-Ming Sheu, Sheng-Jier Yang, J. Hsieh, 2009, IEEE Transactions on Electron Devices.

Design and fabrication of deep submicron CMOS technology compatible suspended high-Q spiral inductors

Wen-Kuan Yeh, Ming-Chun Hsieh, Shuo-Mao Chen, 2004 .

Mechanism of device instability for unhydrogenated polysilicon TFTs under off-state stress

Dun-Nian Yaung, Mong-Song Liang, M. Liang, 2000 .

Impact of the strained SiGe source/drain on hot carrier reliability for 45 nm p-type metal-oxide-semiconductor field-effect transistors

J. C. Hsieh, Yean-Kuen Fang, H. Hsia, 2008 .

Downscaling limit of equivalent oxide thickness in formation of ultrathin gate dielectric by thermal-enhanced remote plasma nitridation

Chih-Wei Yang, Mong-Song Liang, Tze-Liang Lee, 2002 .

The Geometry Effect of Contact Etch Stop Layer Impact on Device Performance and Reliability for 90-nm SOI nMOSFETs

Wen-Kuan Yeh, Chien-Ting Lin, Chieh-Ming Lai, 2006, IEEE Transactions on Electron Devices.

Mobility Modulation Technology Impact on Device Performance and Reliability for sub-90nm SOI CMOSFETs

Wen-Kuan Yeh, Chien-Ting Lin, Chieh-Ming Lai, 2005 .

Improvement on Fluorine Effect under High Field Stress in Tungsten-Polycide Gated Metal-Oxide-Semiconductor Field-Effect Transistor with Oxynitride and/or Reoxidized-Oxynitride Gate Dielectric

Mong-Song Liang, Kan-Yuan Lee, M. Liang, 1996 .

SiC/Si heterostructure negative-differential-resistance diode for high-temperature applications

Jyh-Jier Ho, Wen-Tse Hsieh, J. Ho, 1998 .

Mechanism of Chemical Mechanical Planarization Induced Edge Corrosion of Copper Line for Cu/Low-k SiOC Interconnects

Franklin Chau-Nan Hong, Y. Fang, F. Hong, 2007 .

Strain effect and channel length dependence of bias temperature instability on complementary metal-oxide-semiconductor field effect transistors with high-k/SiO2 gate stacks

Tze-Liang Lee, Yean-Kuen Fang, Yong-Tian Hou, 2008 .

Hf-doped and NH3-nitrided high-K gate dielectric thin film with least drain current degradation and flatband voltage shift

Chih-Wei Yang, Mong-Song Liang, Yong-Shiuan Tsair, 2003 .

Effect of polycrystalline-silicon gate types on the opposite flatband voltage shift in n-type and p-type metal–oxide–semiconductor field-effect transistors for high-k-HfO2 dielectric

Chih-Wei Yang, You-Ru Lin, Liang-Gi Yao, 2003 .

Electrical and Optical Characteristics of an a-Si:H/c-Si Heterojunction Switch

Chun-Yen Chang, Chun-Yen Chang, Y. Fang, 1990 .

Switching characteristics of hydrogenated amorphous silicon/crystalline silicon heterojunction devices

Chun-Yen Chang, Chun-Yen Chang, Y. Fang, 1990 .

Ultra high performance planar InGaAs PIN photodiodes for high speed optical fiber communication

Shyh-Fann Ting, S. Ting, Yean-Kuen Fang, 2007 .

Stress Technology Impact on Device Performances and Reliability for Sub-90 nm Silicon-on-Insulator Complementary Metal–Oxide–Semiconductor Field-Effect-Transistors

Wen-Kuan Yeh, Chieh-Ming Lai, Yean-Kuen Fang, 2006 .

The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications

Cheng-Nan Chang, Shyh-Fann Ting, Yong-Shiuan Tsair, 2003 .

The 1.3–1.6 nm nitrided oxide prepared by NH3 nitridation and rapid thermal annealing for 0.1 μm and beyond CMOS technology application

Chih-Wei Yang, Mong-Song Liang, Yong-Shiuan Tsair, 2002 .

A High-Performance n-i-p SiCN Homojunction for Low-Cost and High-Temperature Ultraviolet Detecting Applications

Cheng-I Lin, Feng-Renn Juang, Yen-Ting Chiang, 2011, IEEE Sensors Journal.

Fabrication of very high quantum efficiency planar InGaAs PIN photodiodes through prebake process

S. F. Ting, S. Chang, Y. Fang, 2005 .

Comparative Study of Carbon Monoxide Gas Sensing Mechanism for the LTPS MOS Schottky Diodes With Various Metal Oxides

Cheng-I Lin, Feng-Renn Juang, Yen-Ting Chiang, 2011, IEEE Sensors Journal.

Characterization and modeling of SOI varactors at various temperatures

Guo-Wei Huang, Sheng-Chun Wang, Fu-Liang Yang, 2004 .

Substrate noise-coupling characterization and efficient suppression in CMOS technology

Wen-Kuan Yeh, Shuo-Mao Chen, Yean-Kuen Fang, 2004 .

Organic light-emitting diode on indium zinc oxide film prepared by ion assisted deposition dc sputtering system

Shui-Jinn Wang, Jyh-Jier Ho, Rung-Ywan Tsai, 2002 .

Trench Pd/Si metal‐oxide‐semiconductor Schottky barrier diode for a high sensitivity hydrogen gas sensor

Yean-Kuen Fang, S.-B. Hwang, C. Y. Lin, 1990 .

Investigation and Modeling of Hot Carrier Effects on Performance of 45- and 55-nm NMOSFETs With RF Automatic Measurement

Wen-Shiang Liao, Mao-Chyuan Tang, Chune-Sin Yeh, 2008, IEEE Transactions on Electron Devices.

Temperature dependence of hot-carrier-induced degradation in 0.1 μm SOI nMOSFETs with thin oxide

Fu-Liang Yang, Wen-Kuan Yeh, Wen-Han Wang, 2002 .

Width Effect on Hot-Carrier-Induced Degradation for 90 nm Partially Depleted SOI CMOSFETs

Shing-Tai Pan, Wen-Kuan Yeh, Chieh-Ming Lai, 2005 .