A. Cros

发表

X. Federspiel, D. Angot, V. Huard, 2013, 2013 IEEE International Electron Devices Meeting.
O. Rozeau, D. Noblet, M. Rafik, 2012, 2012 Symposium on VLSI Technology (VLSIT).
L. Ravera, B. Bertrand, Y. Parot, 2012, Other Conferences.
X. Federspiel, A. Cros, A. Bravaix, 2014, 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW).
A. Argan, S. Schanne, S. Suchy, 2014, Astronomical Telescopes and Instrumentation.
A. Cros, C. Viguier, A. Humbert, 1986, Other Conferences.
M. Vinet, F. Andrieu, M. Haond, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).
J. Mazurier, O. Faynot, A. Pofelski, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
J. Rosa, G. Morin, A. Cros, 2012, 2012 IEEE International Conference on Microelectronic Test Structures.
D. Delille, T. Skotnicki, F. Leverd, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
X. Federspiel, V. Huard, A. Cros, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).
M. Feroci, L. Pacciani, P. Soffitta, 2011, Other Conferences.
G. Ghibaudo, G. Bidal, S. Cristoloveanu, 2009, 2009 International Workshop on Junction Technology.
G. Ghibaudo, F. Boeuf, C. Fenouillet-Beranger, 2011, Ulis 2011 Ultimate Integration on Silicon.
G. Ghibaudo, N. Planes, J. Rosa, 2013, 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).
G. Ghibaudo, C. Fenouillet-Beranger, A. Cros, 2013, 2013 International Semiconductor Conference Dresden - Grenoble (ISCDG).
G. Ghibaudo, A. Cros, M. Mouis, 2014, 2014 11th International Workshop on Low Temperature Electronics (WOLTE).
T. Skotnicki, D. Munteanu, A. Cros, 2004, Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
G. Ghibaudo, G. Bidal, T. Skotnicki, 2006, 2009 Symposium on VLSI Technology.
F. Andrieu, O. Weber, D. Esseni, 2013, 2013 IEEE International Electron Devices Meeting.
O. Faynot, F. Andrieu, N. Planes, 2012, 2012 Symposium on VLSI Technology (VLSIT).
D. Delille, T. Skotnicki, S. Monfray, 2003, IEEE International Electron Devices Meeting 2003.
G. Ghibaudo, J. Rosa, D. Gloria, 2013, 2013 IEEE International Electron Devices Meeting.
J. Mazurier, G. Ghibaudo, P. Batude, 2016, 2016 IEEE Symposium on VLSI Technology.
G. Ghibaudo, A. Cros, H. Brut, 2005, Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..
G. Ghibaudo, R. Clerc, D. Rideau, 2014, 2014 International Conference on Microelectronic Test Structures (ICMTS).