E. Pion

BTI variability fundamental understandings and impact on digital logic by the use of extensive dataset

X. Federspiel, D. Angot, V. Huard, 2013, 2013 IEEE International Electron Devices Meeting.

Statistical electrical and failure analysis of electromigration in advanced CMOS nodes for accurate design rules checker

X. Federspiel, D. Ney, V. Huard, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

A bottom-up approach for System-On-Chip reliability

Vincent Huard, Florian Cacho, E. Pion, 2011, Microelectron. Reliab..

Hot Carrier Injection degradation induced dispersion: Model and circuit-level measurement

X. Federspiel, S. K. Singh, V. Huard, 2011, 2011 IEEE International Integrated Reliability Workshop Final Report.

A predictive bottom-up hierarchical approach to digital system reliability

P. Flatresse, P. Mergault, V. Huard, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).

Bottom-up digital system-level reliability modeling

Lorena Anghel, Philippe Flatresse, Vincent Huard, 2011, 2011 IEEE Custom Integrated Circuits Conference (CICC).