P. J. Silverman

A computational model for oxide breakdown: theory and experiments

Bonnie E. Weir, A. Ghetti, Muhammad A. Alam, 2001 .

Ultra-thin gate oxide reliability projections

Don Monroe, A. Ghetti, Gregory Timp, 2002 .

Soft breakdown at all positions along the N-MOSFET

Bonnie E. Weir, Muhammad A. Alam, P. J. Silverman, 2001 .

The relentless march of the MOSFET gate oxide thickness to zero

Donald M. Tennant, A. Kornblit, Gregory Timp, 2000 .

A study of soft and hard breakdown - Part I: Analysis of statistical percolation conductance

Muhammad A. Alam, B. Weir, P. Silverman, 2002 .

Multi-component high-K gate dielectrics for the silicon industry

Fred P. Klemens, Martin L. Green, Glen D. Wilk, 2001 .