A.G. Lewis
发表
R.A. Martin,
A.G. Lewis,
T.Y. Huang,
1986,
1986 International Electron Devices Meeting.
Investigation and reduction of hot electron induced punchthrough (HEIP) effect in submicron PMOSFETs
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1986,
1986 International Electron Devices Meeting.
T.-Y. Huang,
I.-W. Wu,
A. Chiang,
1990,
IEEE Electron Device Letters.
T.-Y. Huang,
I.-W. Wu,
A. Chiang,
1990,
IEEE Electron Device Letters.
T.-Y. Huang,
I.-W. Wu,
A. Chiang,
1989,
IEEE Electron Device Letters.
T.-Y. Huang,
I.-W. Wu,
A. Chiang,
1991,
IEEE Electron Device Letters.
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1987,
IEEE Electron Device Letters.
M. Koyanagi,
R.A. Martin,
Tiao-Yuan Huang,
1987,
IEEE Electron Device Letters.
A.G. Lewis,
1984,
IEEE Transactions on Electron Devices.
T.-Y. Huang,
I.-W. Wu,
A. Chiang,
1990,
IEEE Electron Device Letters.
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1986,
International Electron Devices Meeting.
M. Koyanagi,
R.A. Martin,
M. Koyanagi,
1987,
IEEE Transactions on Electron Devices.
R.A. Martin,
A.G. Lewis,
T.Y. Huang,
1985,
1985 International Electron Devices Meeting.
M. Hack,
M. Hack,
A. Lewis,
1991,
IEEE Electron Device Letters.
A.G. Lewis,
M.P. Brassington,
S.L. Partridge,
1986,
IEEE Transactions on Electron Devices.
M. Koyanagi,
I.-W. Wu,
M. Koyanagi,
1992,
IEEE Electron Device Letters.