Ming-Chin Hung

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

Po-Lun Chen, Tien-Yu Hsieh, Chih-Tsung Tsai, 2010 .

P‐20: An Efficient Method for Improving the Negative‐Bias‐Temperature‐Stress (NBTS) Stability of Amorphous In‐Ga‐Zn‐O TFT

Po-Lun Chen, Wei-Ting Lin, Jiun-Jye Chang, 2010 .

Effects of Ambient Atmosphere on Electrical Characteristics of Al2O3 Passivated InGaZnO Thin Film Transistors during Positive-Bias-Temperature-Stress Operation

Sheng-Yao Huang, Min-Chen Chen, Chih-Tsung Tsai, 2011 .