J K Erwin

Measurement of birefringence for optical recording of disk substrates.

M Mansuripur, H Fu, S Sugaya, 1994, Applied optics.

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements.

J. K. Erwin, M Mansuripur, C. Peng, 2001, Applied optics.

Variation on Zernike's phase-contrast microscope.

J. K. Erwin, M Mansuripur, M. Mansuripur, 2000, Applied optics.

Dielectric tensor characterization for magneto-optical recording media.

J. K. Erwin, M Mansuripur, M. Mansuripur, 1992, Applied optics.

Static tester for characterization of phase-change, dye-polymer, and magneto-optical media for optical data storage.

J. K. Erwin, M Mansuripur, M. Mansuripur, 1999, Applied optics.