M. Schulz

Interface state density in the interelectrode region of overlapping polycrystalline silicon gates

L. Risch, X. Q. Zheng, Karl R. Dr. Hofmann, 1982 .

Diffusion-related implications for langasite resonator operation

M. Schulz, H. Fritze, H.L. Tuller, 2004, IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control.

Precise measurements of BAW and SAW properties of Langasite in the temperature range from 25°C to 1000°C

J. Bardong, H. Fritze, D. Eisele, 2008, 2008 IEEE International Frequency Control Symposium.

Double correlation technique (DDLTS) for the analysis of deep level profiles in semiconductors

M. Schulz, M. Schulz, H. Lefevre, 1977 .