H. J. Kretschmann

Comparison of soft-breakdown triggers for large-area capacitors under constant voltage stress

Jurriaan Schmitz, H. P. Tuinhout, Pierre H. Woerlee, 2001 .

Soft breakdown triggers for large area capacitors under constant voltage stress

Jurriaan Schmitz, H. P. Tuinhout, Pierre H. Woerlee, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).