Eugene Chong

Localization effect of a current-path in amorphous In–Ga–Zn–O thin film transistors with a highly doped buried-layer

Sang Yeol Lee, Dae Hwan Kim, Yong Woo Jeon, 2011 .

Amorphous silicon–indium–zinc oxide semiconductor thin film transistors processed below 150 °C

Sang Yeol Lee, Yoon Soo Chun, Sang Yeol Lee, 2010 .

Origin of threshold voltage shift by interfacial trap density in amorphous InGaZnO thin film transistor under temperature induced stress

Sang Yeol Lee, Dae Hwan Kim, Yong Woo Jeon, 2011 .

Effect of channel thickness on density of states in amorphous InGaZnO thin film transistor

Sang Yeol Lee, Dae Hwan Kim, Yong Woo Jeon, 2011 .