P. M. Bridger

Electron diffusion length and lifetime in p-type GaN

T. C. McGill, Zvonimir Z. Bandic, E. C. Piquette, 1998 .

Correlation between the surface defect distribution and minority carrier transport properties in GaN

T. C. McGill, Zvonimir Z. Bandic, E. C. Piquette, 1998 .

High voltage (450 V) GaN Schottky rectifiers

Joan M. Redwing, T. C. McGill, Zvonimir Z. Bandic, 1999 .

Minority carrier diffusion length and lifetime in GaN

T. C. McGill, Zvonimir Z. Bandic, E. C. Piquette, 1998 .

Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy

T. C. McGill, Zvonimir Z. Bandic, E. C. Piquette, 1999 .