B. Klaasen

Soft error rate scaling for emerging SOI technology options

K. Bernstein, H.-S.P. Wong, P. Oldiges, 2002, 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303).

Theoretical determination of the temporal and spatial structure of /spl alpha/-particle induced electron-hole pair generation in silicon

R. Dennard, M. Ieong, D. F. Heidel, 2000 .