C.-H. Chien
发表
T.-Y. Huang,
H.-C. Lin,
D.-Y. Lee,
2003,
Extended Abstracts of International Workshop on Gate Insulator (IEEE Cat. No.03EX765).
Horng-Chih Lin,
Tiao-Yuan Huang,
Chun-Yen Chang,
1997,
2nd International Symposium on Plasma Process-Induced Damage.
Horng-Chih Lin,
Tiao-Yuan Huang,
Chun-Yen Chang,
1998
.