D. A. Macquistan

Scanning spreading resistance microscopy study of a metalorganic chemical vapor deposited grown InP optoelectronic structure

St. J. Dixon-Warren, S. Ingrey, R. P. Lu, 2001 .

Crystal Quality of III-V Substrate Wafers and Epitaxial Layers Studied by X-Ray Topography

D. A. Macquistan, I. C. Bassignana, 1993 .

Scanning birefringence mapping of semi-insulating GaAs wafers

D. A. Macquistan, I. C. Bassignana, C. Miner, 1992, Proceedings of the 7th Conference on Semi-insulating III-V Materials,.