Michael J. Paisley

100 mm 4HN-SiC Wafers with Zero Micropipe Density

M. Paisley, A. Powell, V. Tsvetkov, 2008 .

Techniques for Minimizing the Basal Plane Dislocation Density in SiC Epilayers to Reduce Vf Drift in SiC Bipolar Power Devices

John W. Palmour, H. Lendenmann, Marek Skowronski, 2006 .

Approaches to Stabilizing the Forward Voltage of Bipolar SiC Devices

John W. Palmour, Marek Skowronski, Mrinal K. Das, 2004 .