Wouter Polspoel

Evaluation of trap creation and charging in thin SiO2 using both SCM and C-AFM

Wilfried Vandervorst, Wouter Polspoel, 2007 .

Conductive atomic force microscopy studies of thin SiO2 layer degradation

Wilfried Vandervorst, Patrick Fiorenza, W. Vandervorst, 2006 .

High-k dielectrics for future generation memory devices (Invited Paper)

Christoph Adelmann, Ben Kaczer, Dirk Wouters, 2009 .