Philippe J. Roussel

Impact of Wire Geometry on Interconnect RC and Circuit Delay

Diederik Verkest, Christopher J. Wilson, Aaron Thean, 2016, IEEE Transactions on Electron Devices.

Fast Ramped Voltage Characterization of Single Trap Bias and Temperature Impact on Time-Dependent \(V_{\rm TH}\) Variability

Naoto Horiguchi, Aaron Thean, Robin Degraeve, 2014, IEEE Transactions on Electron Devices.

Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits

Francky Catthoor, Guido Groeseneken, Jacopo Franco, 2014, IEEE Transactions on Electron Devices.

Impact of process variability on the radiation-induced soft error of nanometer-scale srams in hold and read conditions

Paul Zuber, Dimitri Linten, Eddy Simoen, 2011, 2011 12th European Conference on Radiation and Its Effects on Components and Systems.

NBTI Reliability of SiGe and Ge Channel pMOSFETs With $ \hbox{SiO}_{2}/\hbox{HfO}_{2}$ Dielectric Stack

Jerome Mitard, Liesbeth Witters, Tibor Grasser, 2013, IEEE Transactions on Device and Materials Reliability.

Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs

Naoto Horiguchi, Tibor Grasser, Guido Groeseneken, 2015, IEEE Electron Device Letters.