M. Miyazato

发表

Body PiN diode inactivation with low on-resistance achieved by a 1.2 kV-class 4H-SiC SWITCH-MOS

Yusuke Kobayashi, Tadao Morimoto, Shinsuke Harada, 2017, 2017 IEEE International Electron Devices Meeting (IEDM).

Dependences of contraction/expansion of stacking faults on temperature and current density in 4H-SiC p–i–n diodes

R. Iijima, H. Okumura, T. Shinohe, 2018 .

Short minority carrier lifetimes in highly nitrogen-doped 4H-SiC epilayers for suppression of the stacking fault formation in PiN diodes

H. Tsuchida, T. Kimoto, H. Okumura, 2016 .

Suppression of the Forward Degradation in 4H-SiC PiN Diodes by Employing a Recombination-Enhanced Buffer Layer

H. Tsuchida, T. Kimoto, H. Okumura, 2016, 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).

Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes

H. Tsuchida, T. Kimoto, H. Okumura, 2018 .

Growth of Shockley type stacking faults upon forward degradation in 4H-SiC p-i-n diodes

H. Tsuchida, T. Kimoto, K. Fukuda, 2016 .

Configuration of Hydrogen in Sp3-Rich Amorphous Hydrogenated Carbon Films Prepared by RF Magnetron Sputtering of Graphite

M. Miyazato, A. Higa, M. Toguchi, 1994 .

Influence of basal-plane dislocation structures on expansion of single Shockley-type stacking faults in forward-current degradation of 4H-SiC p–i–n diodes

J. Senzaki, K. Kojima, H. Okumura, 2018 .

Origin analysis of expanded stacking faults by applying forward current to 4H-SiC p–i–n diodes

J. Senzaki, K. Kojima, H. Okumura, 2017 .

Structural analysis of interfacial dislocations and expanded single Shockley-type stacking faults in forward-current degradation of 4H-SiC p-i-n diodes

J. Senzaki, K. Kojima, H. Okumura, 2019, Japanese Journal of Applied Physics.

Improvement of Channel Mobility in 4H-SiC C-Face MOSFETs by H2 Rich Wet Re-Oxidation

K. Fukuda, Y. Sugahara, S. Harada, 2014 .

Extension of Stacking Faults in 4H-SiC pn Diodes under a High Current Pulse Stress

H. Okumura, Tomohisa Kato, K. Hamada, 2016, 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).