R. Kosugi
发表
S. Suzuki,
T. Suzuki,
R. Kosugi,
2002,
IEEE Electron Device Letters.
K. Kojima,
H. Okumura,
S. Ji,
2020
.
K. Kojima,
H. Okumura,
S. Ji,
2019,
Materials Science Forum.
H. Okumura,
Y. Yonezawa,
K. Mochizuki,
2019,
IEEE Journal of the Electron Devices Society.
H. Okumura,
Y. Yonezawa,
K. Mochizuki,
2019,
Japanese Journal of Applied Physics.
K. Kojima,
H. Okumura,
S. Ji,
2018,
Materials Science Forum.
K. Kojima,
H. Okumura,
S. Ji,
2017
.
K. Kojima,
H. Okumura,
S. Ji,
2017
.
K. Kojima,
Yasunori Tanaka,
H. Okumura,
2015
.
K. Kojima,
Yasunori Tanaka,
H. Okumura,
2015
.
T. Yatsuo,
K. Kojima,
Yasunori Tanaka,
2014
.
Tsutomu Yatsuo,
Ryoji Kosugi,
Hajime Okumura,
2014,
2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
T. Yatsuo,
K. Kojima,
Yasunori Tanaka,
2013
.
K. Fukuda,
S. Harada,
J. Senzaki,
2002,
IEEE Electron Device Letters.
T. Umeda,
T. Ohshima,
S. Onoda,
2018
.
T. Umeda,
T. Ohshima,
S. Onoda,
2018,
Materials Science Forum.
T. Umeda,
T. Ohshima,
K. Fukuda,
2011
.
Tomohisa Kato,
K. Arai,
M. Khan,
2002
.
D. Okamoto,
H. Yano,
M. Sometani,
2017
.
Alpana Nayak,
Yasuo Cho,
S. Harada,
2017
.
K. Fukuda,
H. Nonaka,
S. Ichimura,
2008
.
T. Umeda,
T. Ohshima,
H. Okamoto,
2012
.
W. Cho,
K. Fukuda,
J. Senzaki,
2000
.
H. Okumura,
S. Ji,
Y. Yonezawa,
2019,
Japanese Journal of Applied Physics.
H. Okumura,
Y. Yonezawa,
K. Mochizuki,
2018,
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
K. Kojima,
H. Okumura,
S. Ji,
2016,
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).
H. Okumura,
S. Ji,
Y. Yonezawa,
2019,
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD).
K. Tono,
M. Shimomura,
T. Ohta,
1999
.
Y. Takakuwa,
R. Kosugi,
S. Kono,
1998
.
H. Okumura,
Y. Yonezawa,
K. Mochizuki,
2019,
Materials Science Forum.
Ryoji Kosugi,
Takahide Umeda,
T. Umeda,
2011
.
Y. Takakuwa,
R. Kosugi,
S. Kono,
1999
.
H. Tsuchida,
K. Kojima,
H. Okumura,
2008
.
Y. Takakuwa,
R. Kosugi,
S. Kono,
1999
.
Hiroshi Yano,
Ryoji Kosugi,
Shinsuke Harada,
2014,
IEEE Electron Device Letters.
Kenji Fukuda,
Ryoji Kosugi,
Shinsuke Harada,
2002
.
H. Okushi,
K. Fukuda,
K. Koike,
2000
.
Kenji Fukuda,
Ryoji Kosugi,
Shinsuke Harada,
2002
.
T. Hiyoshi,
T. Masuda,
R. Kosugi,
2016,
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).
K. Kojima,
H. Okumura,
S. Ji,
2016
.
D. Okamoto,
H. Yano,
Xufang Zhang,
2017
.
K. Fukuda,
K. Arai,
R. Kosugi,
2003
.
Kenji Fukuda,
Ryoji Kosugi,
Seiji Suzuki,
2000
.
W. Cho,
K. Fukuda,
S. Harada,
2000
.
Hajime Okumura,
Y. Tanaka,
Y. Cho,
2016,
Microelectron. Reliab..
Yasuo Cho,
S. Harada,
Yasunori Tanaka,
2016,
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM).
Yasuo Cho,
S. Harada,
Yasunori Tanaka,
2016,
2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
K. Fukuda,
M. Okamoto,
K. Arai,
2002
.
J. Senzaki,
T. Mitani,
H. Yamaguchi,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
R. Iijima,
S. Harada,
H. Kitai,
2018,
Materials Science Forum.
H. Okumura,
Y. Yonezawa,
K. Mochizuki,
2020,
Japanese Journal of Applied Physics.
K. Fukuda,
S. Harada,
J. Senzaki,
2001
.
Kenji Fukuda,
Ryoji Kosugi,
Seiji Suzuki,
2002
.