G. Dixit

Characterization of contact and via failure under short duration high pulsed current stress

Kaustav Banerjee, A. Amerasekera, Chenming Hu, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.

The effect of interconnect scaling and low-k dielectric on the thermal characteristics of the IC metal

A. Amerasekera, Chenming Hu, K. Banerjee, 1996, International Electron Devices Meeting. Technical Digest.

Temperature and current effects on small-geometry-contact resistance

Chenming Hu, K. Banerjee, G. Dixit, 1997, International Electron Devices Meeting. IEDM Technical Digest.