Kiyoteru Kobayashi

Leakage current and paramagnetic defects in SiCN dielectrics for copper diffusion barriers

Hisashi Yokoyama, Kiyoteru Kobayashi, Masato Endoh, 2008 .

Model for the substrate hole current based on thermionic hole emission from the anode during Fowler–Nordheim electron tunneling in n‐channel metal‐oxide‐semiconductor field‐effect transistors

Makoto Hirayama, Akinobu Teramoto, A. Teramoto, 1995 .

Dielectric breakdown caused by hole-induced-defect in thin SiO2 films

Makoto Hirayama, Yasuji Matsui, Akinobu Teramoto, 1997 .

Novel Shallow Trench Isolation Process from Viewpoint of Total Strain Process Design for 45 nm Node Devices and Beyond

Y. Ohji, M. Inuishi, T. Kuroi, 2005 .