Kenneth H. K. Yau

On-wafer S-parameter de-embedding of silicon active and passive devices up to 170 GHz

Sorin P. Voinigescu, Pascal Chevalier, Alexander Tomkins, 2010, 2010 IEEE MTT-S International Microwave Symposium.

On-die source-pull for the characterization of the W-band noise performance of 65 nm general purpose (GP) and low power (LP) n-MOSFETs

Sorin P. Voinigescu, Ming-Ta Yang, Peter Schvan, 2009, 2009 IEEE MTT-S International Microwave Symposium Digest.