Toshio Seki

发表

Nano-Processing with Gas Cluster Ion Beams

Takaaki Aoki, Isao Yamada, Zinetulla Insepov, 2000 .

A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion source

Takaaki Aoki, Isao Yamada, Noriaki Toyoda, 2004 .

Modeling of surface smoothing process by cluster ion beam irradiation

Takaaki Aoki, Isao Yamada, I. Yamada, 2003 .