R Liang

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements.

J. K. Erwin, M Mansuripur, C. Peng, 2001, Applied optics.

Variation on Zernike's phase-contrast microscope.

J. K. Erwin, M Mansuripur, M. Mansuripur, 2000, Applied optics.