Yoo-Chan Jeon

30 nm ultra-thin-body SOI MOSFET with selectively deposited Ge raised S/D

Jeffrey Bokor, Pushkar Ranade, Chenming Hu, 2000, 58th DRC. Device Research Conference. Conference Digest (Cat. No.00TH8526).

Thermal stability of Ir/polycrystalline-Si structure for bottom electrode of integrated ferroelectric capacitors

Jae-Hyun Joo, Ki-Young Oh, J. Roh, 1997 .

PD INDUCED LATERAL CRYSTALLIZATION OF AMORPHOUS SI THIN FILMS

Seung-Ki Joo, S. Joo, Yoo-Chan Jeon, 1995 .